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30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
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30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
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Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy - Yang - 2016 - Scanning - Wiley Online Library
2: A schematic illustrating the working principle of the atomic force... | Download Scientific Diagram
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Dynamic-mode AFM: the probe is excited by a piezoelectric element to... | Download Scientific Diagram
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A typical illustration of a piezoelectric tube scanner. a Side view and... | Download Scientific Diagram
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Schematic description of a dual actuated atomic force microscope. 2.... | Download Scientific Diagram
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